Scanning Electron Microscope(SEM)

Tungsten Filament Scanning Electron Microscope | SEM3200

a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.

> Low Voltage
Carbon material specimens with shallow penetration depth at low voltage. The true topography of the specimen surface can be obtained with rich details.

> Low Vacuum
Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive specimens can be achieved without coating.

> Large Field of View
Biological specimens, using a large field of view observation, can easily obtain the overall morphology details of a ladybug's head, demonstrating cross-scale imaging ability.

> Auto Focus
One-button focus for fast imaging.

> Auto Brightness & Contrast
One-click auto brightness & contrast to tune appropriate images' grayscale.

Focused Ion Beam Scanning Electron Microscope | DB500

a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability that ensures its nano-scale analytical capability. The ion column facilitates a Ga+ liquid metal ion source with a highly stable and high-quality ion beam to ensure nano-fabrication capability.

DB500 is equipped with an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and 24 expansion ports, making it an all-around nano-analysis and fabrication platform with comprehensive configurations and expandability.

• “SuperTunnel” Electron Optics technology with a magnetic-free objective lens, suitable for high-resolution imaging, and compatible with magnetic specimen imaging.

• The focused ion beam column which outputs a highly stable, high-quality ion beam, suitable for high-quality nano-fabrication and TEM specimen preparation.

• A piezoelectrically-driven manipulator located in the specimen chamber with an integrated control system for precise handling.

• Independently developed system with strong expandability. The integrated ion source assembly design for quick ion source exchange. Excellent service, supported by an included three-year warranty.